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Design for Testability and Testing

Coordinated by: Mariana Ilaş


The Design for Testability and Testing discipline presents the master students the basic principles and several design and testing methods to identify possible fabrication defects in digital integrated circuits.

Students learn how to implement various types of DFT (Design for Test) architectures and ATPG (Automatic Test Pattern Generation) algorithms to identify defects. The discipline includes both lecture classes and hand-on classes.